Hemispherical analyser with 2-D PSD for zero-degree Auger projectile spectroscopy

Loading...
Thumbnail Image

Date

Authors

Benis, E. P.
Zouros, T. J. M.
Aliabadi, H.
Richard, P.

Journal Title

Journal ISSN

Volume Title

Publisher

Abstract

Type of the conference item

Journal type

peer reviewed

Educational material type

Conference Name

Journal name

Physica Scripta

Book name

Book series

Book edition

Alternative title / Subtitle

Description

Details of a new high gain zero-degree Auger projectile electron spectrograph using a hemispherical analyser and a 2-dimensional position sensitive detector (PSD) with multichannel plates and a resistive anode encoder are presented. A four-element lens mounted at the entrance of the analyser, provides a virtual slit for the incoming electrons by focusing them while at the same time decelerating them to improve their energy resolution. Electrons enter through an aperture at a position Ro which is displaced (along the energy dispersion axis) with respect to the commonly used central entrance position at 1/2 (R(1) + R(2)) The analyser has an acceptance energy range of 20% and an energy resolution of 0.9%. An ion-optics trajectory simulation indicates improved focusing properties for this off-center position thus avoiding the need for cumbersome fringing field correction schemes. Test measurements of high resolution projectile Anger spectra produced in 21.7 MeV collisions of F(8+) and F(7+) projectiles with H(2) and He are presented.

Description

Keywords

Subject classification

Citation

Link

<Go to ISI>://000082093100146
http://iopscience.iop.org/1402-4896/1999/T80B/146/pdf/1402-4896_1999_T80B_146.pdf

Language

en

Publishing department/division

Advisor name

Examining committee

General Description / Additional Comments

Institution and School/Department of submitter

Πανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών και Τεχνολογιών. Τμήμα Βιολογικών Εφαρμογών και Τεχνολογιών

Table of contents

Sponsor

Bibliographic citation

Name(s) of contributor(s)

Number of Pages

Course details

Endorsement

Review

Supplemented By

Referenced By