The hemispherical deflector analyser revisited - II. Electron-optical properties
| dc.contributor.author | Benis, E. P. | en |
| dc.contributor.author | Zouros, T. J. M. | en |
| dc.date.accessioned | 2015-11-24T18:33:57Z | |
| dc.date.available | 2015-11-24T18:33:57Z | |
| dc.identifier.issn | 0368-2048 | - |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/16848 | |
| dc.rights | Default Licence | - |
| dc.subject | electron spectroscopy | en |
| dc.subject | esca | en |
| dc.subject | hemispherical analyser | en |
| dc.subject | paracentric hemispherical analyser | en |
| dc.subject | fringing fields | en |
| dc.subject | energy resolution | en |
| dc.subject | 2-d psd | en |
| dc.subject | kepler orbits | en |
| dc.subject | spectroscopy | en |
| dc.subject | 0-degrees | en |
| dc.subject | collisions | en |
| dc.subject | design | en |
| dc.subject | lens | en |
| dc.subject | spectrograph | en |
| dc.subject | optimization | en |
| dc.title | The hemispherical deflector analyser revisited - II. Electron-optical properties | en |
| heal.abstract | Using the basic spectrometer trajectory equation for motion in an ideal 1/r potential derived in Eq. (101) of part I [T.J.M. Zouros, E.P. Benis, J. Electron Spectrosc. Relat. Phenom. 125 (2002) 221], the operational characteristics of a hemispherical deflector analyser (HDA) such as dispersion, energy resolution, energy calibration, input lens magnification and energy acceptance window are investigated from first principles. These characteristics are studied as a function of the entry point R(0) and the nominal value of the potential V(R(0)) at entry. Electron-optics simulations and actual laboratory measurements are compared to our theoretical results for an ideal biased paracentric HDA using a four-element zoom lens and a two-dimensional position sensitive detector (2D-PSD). These results should be of particular interest to users of modem HDAs utilizing a PSD. (C) 2008 Elsevier B.V. All rights reserved. | en |
| heal.access | campus | - |
| heal.fullTextAvailability | TRUE | - |
| heal.identifier.primary | DOI 10.1016/j.elspec.2008.02.001 | - |
| heal.identifier.secondary | <Go to ISI>://000257038400005 | - |
| heal.identifier.secondary | http://ac.els-cdn.com/S0368204808000030/1-s2.0-S0368204808000030-main.pdf?_tid=4ec75736-4de8-11e3-8aa9-00000aacb35f&acdnat=1384514770_e1a2b011cc6700350becec52143f5d5e | - |
| heal.journalName | Journal of Electron Spectroscopy and Related Phenomena | en |
| heal.journalType | peer reviewed | - |
| heal.language | en | - |
| heal.publicationDate | 2008 | - |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών και Τεχνολογιών. Τμήμα Βιολογικών Εφαρμογών και Τεχνολογιών | el |
| heal.type | journalArticle | - |
| heal.type.el | Άρθρο Περιοδικού | el |
| heal.type.en | Journal article | en |
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