Microstructure and nanomechanical and optical properties of single- and multi-layer carbon films synthesized by radio frequency sputtering

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dc.contributor.authorLu, W.en
dc.contributor.authorKomvopoulos, K.en
dc.contributor.authorPatsalas, P.en
dc.contributor.authorCharitidis, C.en
dc.contributor.authorGioti, M.en
dc.contributor.authorLogothetidis, S.en
dc.date.accessioned2015-11-24T17:36:01Z
dc.date.available2015-11-24T17:36:01Z
dc.identifier.issn0257-8972-
dc.identifier.urihttps://olympias.lib.uoi.gr/jspui/handle/123456789/14197
dc.rightsDefault Licence-
dc.subjectcarbon filmen
dc.subjectpropertiesen
dc.subjectradio frequency sputteringen
dc.subjectindentationen
dc.subjectx-ray diffractionen
dc.subjectx-ray reflectivityen
dc.subjectspectroscopic ellipsometryen
dc.subjectpostgrowth ion irradiationen
dc.subjectpulsed-laser depositionen
dc.subjectx-ray reflectivityen
dc.subjectthin-filmsen
dc.subjectdiamonden
dc.subjectstabilityen
dc.subjectdensityen
dc.subjectsiliconen
dc.subjectstressen
dc.subjectgrowthen
dc.titleMicrostructure and nanomechanical and optical properties of single- and multi-layer carbon films synthesized by radio frequency sputteringen
heal.abstractSubmicrometer-thick hard carbon films were deposited on smooth Si( 1 0 0) substrates by radio frequency sputtering. To avoid the development of high residual stresses during film growth under energetic ion bombardment, films were synthesized by either sputtering alternating ultrathin layers of soft and hard amorphous carbon (a-C) or by compounding a-C films with small amounts of nitrogen during deposition. Hardness and elastic modulus measurements were obtained from indentation experiments performed with a surface force microscope and a nanoindenter using the slope of the unloading curve and the continuous stiffness method. The thickness and hardness of a multi-layer film consisting of five bilayers of soft/hard ultrathin a-C layers were found to be equal to similar to115 nm and similar to28 GPa, respectively, and the corresponding values of a single-layer nitrogenated amorphous carbon (a-CNx) film (deposited under conditions similar to those of the hard ultrathin a-C layers) were found to be equal to similar to222 nm and similar to20 GPa. The microstructure and interface roughness of the films were examined by X-ray diffraction (XRD) and X-ray reflectivity (XRR), respectively, and the optical properties by spectroscopic ellipsometry (SE). XRD results showed that the multi-layer film is amorphous, and that some crystalline phases are present in the single-layer a-CNx film. XRR studies revealed that the density of the soft and hard a-C layers and the relatively thick a-CNx film is equal to 2.2, 2.5 and 2.39 g/cm(3), respectively. According to the SE results, the multi-layer a-C film is dense and rich in sp(2) (similar to70 at.%) carbon bonds, whereas the single-layer a-CNx film exhibits high optical absorption at low photon energy. (C) 2002 Elsevier Science B.V. All rights reserved.en
heal.accesscampus-
heal.fullTextAvailabilityTRUE-
heal.identifier.primaryDoi 10.1016/S0257-8972(02)00841-1-
heal.identifier.secondary<Go to ISI>://000182105100002-
heal.journalNameSurface & Coatings Technologyen
heal.journalTypepeer reviewed-
heal.languageen-
heal.publicationDate2003-
heal.publisherElsevieren
heal.recordProviderΠανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικώνel
heal.typejournalArticle-
heal.type.elΆρθρο Περιοδικούel
heal.type.enJournal articleen

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