Domino CMOS SCD/SFS 2-out-of-3 and 1-out-of-3 code checkers

Haniotakis, T.; Tsiatouhas, Y.; Efstathiou, C.; Nikolos, D.

Domino CMOS SCD/SFS 2-out-of-3 and 1-out-of-3 code checkers

dc.contributor.author	Haniotakis, T.	en
dc.contributor.author	Tsiatouhas, Y.	en
dc.contributor.author	Efstathiou, C.	en
dc.contributor.author	Nikolos, D.	en
dc.date.accessioned	2015-11-24T17:00:22Z
dc.date.available	2015-11-24T17:00:22Z
dc.identifier.issn	0020-7217	-
dc.identifier.uri	https://olympias.lib.uoi.gr/jspui/handle/123456789/10757
dc.rights	Default Licence	-
dc.subject	strongly fault-secure	en
dc.subject	self-checking checker	en
dc.subject	disjoint checkers	en
dc.subject	efficient design	en
dc.subject	circuits	en
dc.subject	logic	en
dc.title	Domino CMOS SCD/SFS 2-out-of-3 and 1-out-of-3 code checkers	en
heal.abstract	In this paper we present new strongly code-disjoint (SCD) and strongly fault-secure (SFS) checkers for the 2-out-of-3 and 1-out-of-3 codes. They are implemented in Domino CMOS logic and take into account a comprehensive fault model consisting of stuck-at, transistor stuck-open and transistor stuck-on faults. The proposed checkers are the first known SCD/SFS 2-out-of-3 and 1-out-of-3 code checkers in the open literature that consider the above fault model without suffering from static power consumption.	en
heal.access	campus	-
heal.fullTextAvailability	TRUE	-
heal.identifier.primary	Doi 10.1080/00207210310001595383	-
heal.journalName	International Journal of Electronics	en
heal.journalType	peer reviewed	-
heal.language	en	-
heal.publicationDate	2003	-
heal.recordProvider	Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής	el
heal.type	journalArticle	-
heal.type.el	Άρθρο Περιοδικού	el
heal.type.en	Journal article	en

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