A new hemispherical analyser with 2-D PSD and focusing lens for use in 0 degrees electron spectroscopy

Loading...
Thumbnail Image

Date

Authors

Benis, E. P.
Zaharakis, K.
Voultsidou, M. M.
Zouros, T. J. M.
Stockli, M.
Richard, P.
Hagmann, S.

Journal Title

Journal ISSN

Volume Title

Publisher

Abstract

Type of the conference item

Journal type

peer reviewed

Educational material type

Conference Name

Journal name

Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms

Book name

Book series

Book edition

Alternative title / Subtitle

Description

A new electron spectrograph has been developed to study electron emission in ion-atom collisions and in particular for use in 0 degrees Auger projectile spectroscopy. It incorporates a hemispherical analyser, a 2-dimensional position-sensitive detector (PSD) with multichannel plates and a resistive anode encoder. A novel feature of this analyser is the use of an asymmetric entrance aperture and a non-zero entrance potential to improve focusing by correcting for fringing field effects. A four-element lens mounted at the entrance of the analyser, provides a virtual slit, focusing and decelerating incoming electrons for improved enery resolution and reduction of the ion beam scattering at the spectrometer entrance. The analyser has an acceptance energy range of 20%. As a first test of the apparatus, the production of Binary Encounter electrons from 20 MeV F-9+,F-8+ + H-2 collisions was measured. The bare F9+ results were used for an in situ calibration of the 2D-PSD overall efficiency. The F8+ data were found to be in good agreement with the elastic electron scattering model. (C) 1998 Elsevier Science B.V. All rights reserved.

Description

Keywords

hemispherical electron spectrometer/spectrograph, o degrees auger projectile spectroscopy, binary encounter electrons, energy-loss spectrometer, collisions, analyzer, ions

Subject classification

Citation

Link

<Go to ISI>://000077719400020
http://ac.els-cdn.com/S0168583X98004820/1-s2.0-S0168583X98004820-main.pdf?_tid=911bdc42-4de8-11e3-a29f-00000aab0f6b&acdnat=1384514881_ba71c222cc7e1d713d52d3eea9f47d5f

Language

en

Publishing department/division

Advisor name

Examining committee

General Description / Additional Comments

Institution and School/Department of submitter

Πανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών και Τεχνολογιών. Τμήμα Βιολογικών Εφαρμογών και Τεχνολογιών

Table of contents

Sponsor

Bibliographic citation

Name(s) of contributor(s)

Number of Pages

Course details

Endorsement

Review

Supplemented By

Referenced By