Optimal selective Huffman coding for test-data compression

dc.contributor.authorKavousianos, X.en
dc.contributor.authorKalligeros, E.en
dc.contributor.authorNikolos, D.en
dc.date.accessioned2015-11-24T17:01:30Z
dc.date.available2015-11-24T17:01:30Z
dc.identifier.issn0018-9340-
dc.identifier.urihttps://olympias.lib.uoi.gr/jspui/handle/123456789/10936
dc.rightsDefault Licence-
dc.subjectembedded testing techniquesen
dc.subjectip coresen
dc.subjectselective huffman codingen
dc.subjecttest-data compressionen
dc.subjecta-chip testen
dc.subjectcircuitsen
dc.subjectcodesen
dc.subjectpoweren
dc.titleOptimal selective Huffman coding for test-data compressionen
heal.abstractSelective Huffman coding has recently been proposed for efficient test-data compression with low hardware overhead. In this paper, we show that the already proposed encoding scheme is not optimal and we present a new one, proving that it is optimal. Moreover, we compare the two encodings theoretically and we derive a set of conditions which show that, in practical cases, the proposed encoding always offers better compression. In terms of hardware overhead, the new scheme is at least as low-demanding as the old one. The increased compression efficiency, the resulting test-time savings, and the low hardware overhead of the proposed method are also verified experimentally.en
heal.accesscampus-
heal.fullTextAvailabilityTRUE-
heal.identifier.primaryDoi 10.1109/Tc.2007.1057-
heal.journalNameIEEE Transactions on Computersen
heal.journalTypepeer reviewed-
heal.languageen-
heal.publicationDate2007-
heal.recordProviderΠανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικήςel
heal.typejournalArticle-
heal.type.elΆρθρο Περιοδικούel
heal.type.enJournal articleen

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