A design for testability scheme for CMOS LC-Tank voltage controlled oscillators
| dc.contributor.author | Dermentzoglou, L. | en |
| dc.contributor.author | Tsiatouhas, Y. | en |
| dc.contributor.author | Arapoyanni, A. | en |
| dc.date.accessioned | 2015-11-24T17:00:37Z | |
| dc.date.available | 2015-11-24T17:00:37Z | |
| dc.identifier.issn | 0923-8174 | - |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/10792 | |
| dc.rights | Default Licence | - |
| dc.subject | voltage controlled oscillator (vcos) | en |
| dc.subject | design for testability (dft) | en |
| dc.subject | radio frequency (rf) testing | en |
| dc.title | A design for testability scheme for CMOS LC-Tank voltage controlled oscillators | en |
| heal.abstract | In this paper, anew Design for Testability (DFT) scheme is proposed, for the testing of LC-tank CMOS Voltage Controlled Oscillators (VCOs). The proposed test-circuit is capable of detecting hard (catastrophic) and soft (parametric) faults, injected in the VCO. The test result is provided by a digital Fail/Pass signal. Simulation results reveal the effectiveness of the proposed circuit. The overall silicon area requirement of the proposed DFT scheme is negligible. | en |
| heal.access | campus | - |
| heal.fullTextAvailability | TRUE | - |
| heal.journalName | Journal of Electronic Testing-Theory and Applications | en |
| heal.journalType | peer reviewed | - |
| heal.language | en | - |
| heal.publicationDate | 2004 | - |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής | el |
| heal.type | journalArticle | - |
| heal.type.el | Άρθρο Περιοδικού | el |
| heal.type.en | Journal article | en |
Αρχεία
Φάκελος/Πακέτο αδειών
1 - 1 of 1
Φόρτωση...
- Ονομα:
- license.txt
- Μέγεθος:
- 1.74 KB
- Μορφότυπο:
- Item-specific license agreed upon to submission
- Περιγραφή: