Biomolecular layer thickness evaluation using White Light Reflectance Spectroscopy
| dc.contributor.author | Kitsara, M. | en |
| dc.contributor.author | Petrou, P. | en |
| dc.contributor.author | Kontziampasis, D. | en |
| dc.contributor.author | Misiakos, K. | en |
| dc.contributor.author | Makarona, E. | en |
| dc.contributor.author | Raptis, I. | en |
| dc.contributor.author | Beltsios, K. | en |
| dc.date.accessioned | 2015-11-24T17:32:21Z | |
| dc.date.available | 2015-11-24T17:32:21Z | |
| dc.identifier.issn | 0167-9317 | - |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/13715 | |
| dc.rights | Default Licence | - |
| dc.subject | reflectance spectroscopy | en |
| dc.subject | atomic force microscopy | en |
| dc.subject | biomolecular layer | en |
| dc.subject | gamma-globulins | en |
| dc.subject | ellipsometry | en |
| dc.subject | adsorption | en |
| dc.subject | surfaces | en |
| dc.subject | arrays | en |
| dc.subject | afm | en |
| dc.title | Biomolecular layer thickness evaluation using White Light Reflectance Spectroscopy | en |
| heal.abstract | A White Light Reflectance Spectroscopy (WLRS) methodology is applied in the evaluation of the effectiveness of biomolecules immobilization onto solid surfaces as well as their subsequent reaction with counterpart biomolecules via measuring the respective layers thickness. In particular we investigated the adsorption of rabbit and mouse gamma-globulins as well as their reaction with complementary antibodies. The results obtained with the proposed methodology were compared with those received by atomic force microscopy analysis of the same samples. It was found that the developed method provides a simple, very fast and accurate approach for thin biomolecular layers thickness determination. (C) 2009 Elsevier B.V. All rights reserved. | en |
| heal.access | campus | - |
| heal.fullTextAvailability | TRUE | - |
| heal.identifier.primary | DOI 10.1016/j.mee.2009.11.082 | - |
| heal.identifier.secondary | <Go to ISI>://000276300700030 | - |
| heal.identifier.secondary | http://ac.els-cdn.com/S0167931709007370/1-s2.0-S0167931709007370-main.pdf?_tid=c14f201f8f00d2c47b0042ce506c519c&acdnat=1339662483_9c103218051f13aa7d604bc280520897 | - |
| heal.journalName | Microelectronic Engineering | en |
| heal.journalType | peer reviewed | - |
| heal.language | en | - |
| heal.publicationDate | 2010 | - |
| heal.publisher | Elsevier | en |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών | el |
| heal.type | journalArticle | - |
| heal.type.el | Άρθρο Περιοδικού | el |
| heal.type.en | Journal article | en |
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