A circuit for concurrent detection of soft and timing errors in digital CMOS ICs

dc.contributor.author	Matakias, S.	en
dc.contributor.author	Tsiatouhas, Y.	en
dc.contributor.author	Arapoyanni, A.	en
dc.contributor.author	Haniotakis, T.	en
dc.date.accessioned	2015-11-24T17:00:46Z
dc.date.available	2015-11-24T17:00:46Z
dc.identifier.issn	0923-8174	-
dc.identifier.uri	https://olympias.lib.uoi.gr/jspui/handle/123456789/10811
dc.rights	Default Licence	-
dc.subject	concurrent testing	en
dc.subject	soft and timing errors	en
dc.subject	monitoring circuits	en
dc.subject	time redundancy	en
dc.title	A circuit for concurrent detection of soft and timing errors in digital CMOS ICs	en
heal.abstract	In this paper a new circuit for concurrent soft and timing error detection in CMOS ICs is presented. The circuit is based on current mode sense amplifier topologies to provide fast error detection times. After an error has been detected it can be corrected by using a retry cycle.	en
heal.access	campus	-
heal.fullTextAvailability	TRUE	-
heal.journalName	Journal of Electronic Testing-Theory and Applications	en
heal.journalType	peer reviewed	-
heal.language	en	-
heal.publicationDate	2004	-
heal.recordProvider	Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής	el
heal.type	journalArticle	-
heal.type.el	Άρθρο Περιοδικού	el
heal.type.en	Journal article	en

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