Preliminary test and Stein-type estimation of location parameter for elliptically contoured distributions.
| dc.contributor.author | Men?ndez, M. L. | en |
| dc.contributor.author | Pardo, L. | en |
| dc.contributor.author | Zografos, K. | en |
| dc.date.accessioned | 2015-11-24T17:27:41Z | |
| dc.date.available | 2015-11-24T17:27:41Z | |
| dc.identifier.issn | 0972-3617 | - |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/13429 | |
| dc.rights | Default Licence | - |
| dc.title | Preliminary test and Stein-type estimation of location parameter for elliptically contoured distributions. | en |
| heal.access | campus | - |
| heal.fullTextAvailability | TRUE | - |
| heal.journalName | Advances and Applications in Statistics | en |
| heal.journalType | peer reviewed | - |
| heal.publicationDate | 2009 | - |
| heal.publisher | Pushpa Publishing House | en |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μαθηματικών | el |
| heal.type | journalArticle | - |
| heal.type.el | Άρθρο Περιοδικού | el |
| heal.type.en | Journal article | en |
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