X-ray and neutron reflectivity studies of self-assembled InAs quantum dots stacks on GaAs (100)
| dc.contributor.author | Anagnostopoulos, D. F. | en |
| dc.contributor.author | Skuras, E. | en |
| dc.contributor.author | Stanley, C. | en |
| dc.contributor.author | Borchert, G. L. | en |
| dc.contributor.author | Valicu, R. | en |
| dc.date.accessioned | 2015-11-24T17:32:02Z | |
| dc.date.available | 2015-11-24T17:32:02Z | |
| dc.identifier.issn | 0925-8388 | - |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/13659 | |
| dc.rights | Default Licence | - |
| dc.subject | quantum dots | en |
| dc.subject | x-ray reflectivity | en |
| dc.subject | neutron reflectivity | en |
| dc.subject | atomic scale structure | en |
| dc.subject | solar-cells | en |
| dc.title | X-ray and neutron reflectivity studies of self-assembled InAs quantum dots stacks on GaAs (100) | en |
| heal.abstract | X-ray and neutron reflectometry are used for structural characterization of self-assembled InAs quantum dot stacks on GaAs (1 0 0), grown by molecular beam epitaxy. The macroscopic density profile of uncapped InAs layer is extracted and shows a three-dimensional pyramidal structure of maximum height of 5 nm. The ultra thin InAs buried layers are well approximated as a two-dimensional structure, indicating amalgamation between InAs and GaAs. The interface roughness of the capping layers is found smaller than 0.5 nm, showing the high quality of the epitaxial surfaces. The thicknesses of the capping GaAs layers are extracted in atomic scale level and are found in fine agreement with the nominal values. (C) 2008 Published by Elsevier B.V. | en |
| heal.access | campus | - |
| heal.fullTextAvailability | TRUE | - |
| heal.identifier.primary | DOI 10.1016/j.jallcom.2008.08.113 | - |
| heal.identifier.secondary | <Go to ISI>://000270619600099 | - |
| heal.journalName | Journal of Alloys and Compounds | en |
| heal.journalType | peer reviewed | - |
| heal.language | en | - |
| heal.publicationDate | 2009 | - |
| heal.publisher | Elsevier | en |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών | el |
| heal.type | journalArticle | - |
| heal.type.el | Άρθρο Περιοδικού | el |
| heal.type.en | Journal article | en |
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