Α source of spurious peaks in α mυlti crystal Χ-ray spectrometer

dc.contributor.authorKotsis Κ.Τ.en
dc.contributor.authorAlexandropoulos Ν.G.en
dc.date.accessioned2015-11-24T17:44:56Z
dc.date.available2015-11-24T17:44:56Z
dc.identifier.urihttps://olympias.lib.uoi.gr/jspui/handle/123456789/14964
dc.rightsDefault Licence-
dc.titleΑ source of spurious peaks in α mυlti crystal Χ-ray spectrometeren
heal.abstractWe demonstrate that, under certain conditions, the spectrum of a monochromatic x-ray beam analysed by a multicrystal spectrometer includes several spurious peaks. These erroneous peaks are the result of the angular separation of dynamically and kinematically diffracted radiation. The above separation of the diffracted radiation occurs when the diffraction takes place near, instead of on, a reciprocal lattice point, at one of the spectrometer s crystals.en
heal.accesscampus-
heal.fullTextAvailabilityTRUE-
heal.identifier.secondaryhttp://iopscience.iop.org/0022-3735/20/1/013-
heal.journalNameJournal of Physics E: Scientific Instrumentsen
heal.journalTypepeer-reviewed-
heal.languageen-
heal.publicationDate1987-
heal.publisherIOP Publishing Ltden
heal.recordProviderΠανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών Αγωγής. Παιδαγωγικό Τμήμα Δημοτικής Εκπαίδευσηςel
heal.typejournalArticle-
heal.type.elΆρθρο Περιοδικούel
heal.type.enJournal articleen

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