Umweg peak intensity dependence οn the incident Χ-ray beam polarization mode

dc.contributor.author	Alexandropoulos Ν.G.	en
dc.contributor.author	Kotsis Κ.Τ.	en
dc.date.accessioned	2015-11-24T17:44:33Z
dc.date.available	2015-11-24T17:44:33Z
dc.identifier.uri	https://olympias.lib.uoi.gr/jspui/handle/123456789/14921
dc.rights	Default Licence	-
dc.title	Umweg peak intensity dependence οn the incident Χ-ray beam polarization mode	en
heal.abstract	The measured intensities of the three beam X-ray diffraction View the MathML source on silicon crystal, for two modes of polarization, show strong dependence from the polarization mode of the incoming X-ray beam. These results are interpreted within the kinematical theory of X-ray diffraction indicating that when the diffracted beam by the secondary plane is parallel to the crystal surface the kinematical approach is a valid approximation.	en
heal.access	campus	-
heal.fullTextAvailability	TRUE	-
heal.identifier.primary	10.1016/0038-1098(94)90421-9	-
heal.identifier.secondary	http://www.sciencedirect.com/science/article/pii/0038109894904219	-
heal.journalName	Solid State Communications	en
heal.journalType	peer-reviewed	-
heal.language	en	-
heal.publicationDate	1994	-
heal.recordProvider	Πανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών Αγωγής. Παιδαγωγικό Τμήμα Δημοτικής Εκπαίδευσης	el
heal.type	journalArticle	-
heal.type.el	Άρθρο Περιοδικού	el
heal.type.en	Journal article	en

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