Coupling Length Scales for Multiscale Atomistics-Continuum Simulations: Atomistically-Induced Stress Distributions in Si/Si3N4 Nanopixels
| dc.contributor.author | Lidorikis, E. | en |
| dc.contributor.author | Bachlechner, M. | en |
| dc.contributor.author | Kalia, M. | en |
| dc.contributor.author | Nakano, A. | en |
| dc.contributor.author | Vashishta, P. | en |
| dc.contributor.author | Voyiadjis, G. | en |
| dc.date.accessioned | 2015-11-24T17:32:52Z | |
| dc.date.available | 2015-11-24T17:32:52Z | |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/13788 | |
| dc.rights | Default Licence | - |
| dc.title | Coupling Length Scales for Multiscale Atomistics-Continuum Simulations: Atomistically-Induced Stress Distributions in Si/Si3N4 Nanopixels | en |
| heal.abstract | A hybrid molecular-dynamics (MD) and finite-element simulation approach is used to study stress distributions in silicon/silicon-nitride nanopixels. The hybrid approach provides atomistic description near the interface and continuum description deep into the substrate, increasing the accessible length scales and greatly reducing the computational cost. The results of the hybrid simulation are in good agreement with full multimillion-atom MD simulations: atomic structures at the lattice-mismatched interface between amorphous silicon nitride and silicon induce inhomogeneous stress patterns in the substrate that cannot be reproduced by a continuum approach alone. | en |
| heal.access | campus | - |
| heal.fullTextAvailability | TRUE | - |
| heal.identifier.primary | DOI: 10.1103/PhysRevLett.87.086104 | - |
| heal.journalName | Phys Rev Lett | en |
| heal.journalType | peer reviewed | - |
| heal.language | en | - |
| heal.publicationDate | 2001 | - |
| heal.publisher | The American Physical Society | en |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών | el |
| heal.type | journalArticle | - |
| heal.type.el | Άρθρο Περιοδικού | el |
| heal.type.en | Journal article | en |
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