Heavy ion RBS characterization of multilayer coatings deposited through the sol-gel technique

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dc.contributor.authorAslanoglou, X.en
dc.contributor.authorAssimakopoulos, P. A.en
dc.contributor.authorTrapalis, C.en
dc.contributor.authorKordas, G.en
dc.contributor.authorKarakassides, M. A.en
dc.contributor.authorPilakouta, M.en
dc.date.accessioned2015-11-24T17:34:43Z
dc.date.available2015-11-24T17:34:43Z
dc.identifier.issn0168-583X-
dc.identifier.urihttps://olympias.lib.uoi.gr/jspui/handle/123456789/14017
dc.rightsDefault Licence-
dc.subjectbackscatteringen
dc.titleHeavy ion RBS characterization of multilayer coatings deposited through the sol-gel techniqueen
heal.abstractMultilayer reflecting thin films of the systems ZrO2-SiO2 and TiO2-SiO2 were deposited on glass surfaces using the sol-gel technique. A C-12 beam was utilized in RBS analysis to investigate the inner structure of these multilayer stacks. The layers showed uniform thickness and no evidence for significant diffusion between the layers was found. Optical Spectroscopy showed wavelength selectivity in the reflection of an 8-layer TiO2-SiO2 sample.en
heal.accesscampus-
heal.fullTextAvailabilityTRUE-
heal.identifier.secondary<Go to ISI>://A1996VN26100121-
heal.journalNameNuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atomsen
heal.journalTypepeer reviewed-
heal.languageen-
heal.publicationDate1996-
heal.publisherElsevieren
heal.recordProviderΠανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικώνel
heal.typejournalArticle-
heal.type.elΆρθρο Περιοδικούel
heal.type.enJournal articleen

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