New efficient totally self-checking Berger code checkers
| dc.contributor.author | Kavousianos, X. | en |
| dc.contributor.author | Nikolos, D. | en |
| dc.contributor.author | Foukarakis, G. | en |
| dc.contributor.author | Gnardellis, T. | en |
| dc.date.accessioned | 2015-11-24T17:03:07Z | |
| dc.date.available | 2015-11-24T17:03:07Z | |
| dc.identifier.issn | 0167-9260 | - |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/11132 | |
| dc.rights | Default Licence | - |
| dc.subject | self-checking circuits | en |
| dc.subject | totally self-checking circuits | en |
| dc.subject | berger codes | en |
| dc.subject | unidirectional errors | en |
| dc.title | New efficient totally self-checking Berger code checkers | en |
| heal.abstract | This paper presents a new method for designing totally self-checking (TSC) Berger code checkers for any number k of information bits, even for k = 2(r-1), taking into account realistic faults as stuck-at, transistor stuck-open, transistor stuck-on and resistive bridging faults. Double- as well as single-output TSC checkers are given. The proposed single-output TSC Berger code checkers are the first in the open literature. The checkers designed following the proposed method are significantly more efficient, with respect to the required area and speed, than the corresponding already known from the open literature checkers. (C) 1999 Elsevier Science B.V. All rights reserved. | en |
| heal.access | campus | - |
| heal.fullTextAvailability | TRUE | - |
| heal.journalName | Integration-the Vlsi Journal | en |
| heal.journalType | peer reviewed | - |
| heal.language | en | - |
| heal.publicationDate | 1999 | - |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής | el |
| heal.type | journalArticle | - |
| heal.type.el | Άρθρο Περιοδικού | el |
| heal.type.en | Journal article | en |
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