Umweg peak high resolution flat crystal Χ-ray spectrometer
| dc.contributor.author | Alexandropoulos Ν.G. | en |
| dc.contributor.author | Kotsis Κ.Τ. | en |
| dc.date.accessioned | 2015-11-24T17:44:39Z | |
| dc.date.available | 2015-11-24T17:44:39Z | |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/14932 | |
| dc.rights | Default Licence | - |
| dc.title | Umweg peak high resolution flat crystal Χ-ray spectrometer | en |
| heal.abstract | The construction of an X-ray wavelength dispersive flat crystal spectrometer using an n-beam diffraction peak is presented here. Such a spectrometer, although it is as simple as a flat crystal Bragg spectrometer, provides higher energy resolution than any other wavelength dispersive spectrometer available today. We demonstrate that by selecting the appropriate crystal and umweg peak for the under investigation wavelength area, the energy resolution can exceed the value.... | en |
| heal.access | campus | - |
| heal.fullTextAvailability | TRUE | - |
| heal.identifier.secondary | http://www.sciencedirect.com/science/article/pii/003810989290607B | - |
| heal.journalName | Solid State Communications | en |
| heal.journalType | peer-reviewed | - |
| heal.language | en | - |
| heal.publicationDate | 1992 | - |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών Αγωγής. Παιδαγωγικό Τμήμα Δημοτικής Εκπαίδευσης | el |
| heal.type | journalArticle | - |
| heal.type.el | Άρθρο Περιοδικού | el |
| heal.type.en | Journal article | en |
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