Comparative study of different current mode sense amplifiers in submicron CMOS technology

dc.contributor.authorChrisanthopoulos, A.en
dc.contributor.authorMoisiadis, Y.en
dc.contributor.authorTsiatouhas, Y.en
dc.contributor.authorArapoyanni, A.en
dc.date.accessioned2015-11-24T17:00:14Z
dc.date.available2015-11-24T17:00:14Z
dc.identifier.issn1350-2409-
dc.identifier.urihttps://olympias.lib.uoi.gr/jspui/handle/123456789/10730
dc.rightsDefault Licence-
dc.subjectsramen
dc.titleComparative study of different current mode sense amplifiers in submicron CMOS technologyen
heal.abstractA comparison of different current mode sense amplifiers using 0.25 mum CMOS technology is presented. The sense amplifiers under consideration are suitable for current sensing in SRAM and Flash non-volatile memories. Simulation results are given regal-ding the sensing delay time for different power supply voltages V-dd and bit-line capacitance values. Comparative results are also provided for the energy dissipated per sensing operation. while worst-case and high-temperature simulations are included, in order to expose limitations of the sensors in various operating conditions.en
heal.accesscampus-
heal.fullTextAvailabilityTRUE-
heal.identifier.primaryDOI 10.1049/ip-cds:200020425-
heal.journalNameIee Proceedings-Circuits Devices and Systemsen
heal.journalTypepeer reviewed-
heal.languageen-
heal.publicationDate2002-
heal.recordProviderΠανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικήςel
heal.typejournalArticle-
heal.type.elΆρθρο Περιοδικούel
heal.type.enJournal articleen

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