Crystallization effects and diamond formation in amorphous carbon films under low energy ion beam irradiation

dc.contributor.authorPatsalas, P.en
dc.contributor.authorLogothetidis, S.en
dc.date.accessioned2015-11-24T17:32:55Z
dc.date.available2015-11-24T17:32:55Z
dc.identifier.issn0168-583X-
dc.identifier.urihttps://olympias.lib.uoi.gr/jspui/handle/123456789/13796
dc.rightsDefault Licence-
dc.subjectamorphous carbonen
dc.subjection irradiationen
dc.subjectx-ray diffractionen
dc.subjectphase transformationen
dc.subjectdiamonden
dc.subjectnucleationen
dc.titleCrystallization effects and diamond formation in amorphous carbon films under low energy ion beam irradiationen
heal.abstractThe crystallization effects occurring in various types of amorphous carbon (a-C) thin films with different structure and bonding induced by post-growth low energy (<1.5 keV) Ar+ ion beam irradiation are presented. Detailed X-ray diffraction (XRD) measurements were used to identify several allotropic forms of carbon such as graphite and diamond as well as SiC detected in a-C films after ion irradiation. The diamond and SiC nucleation occurs close to the a-C/Si interface, beyond the ion penetration depth suggesting a non-direct nucleation mechanism. The relative content, grain size. distribution and orientation of each particular crystalline phase in the films depend strongly on the microstructural characteristics of the as-grown films. We also consider the effects of ion energy and fluence and substrate material on the crystallization process in an effort to get a deeper insight of the fundamental mechanisms occurring during the interaction of various carbon materials with low energy ion beams. (C) 2001 Elsevier Science B.V. All rights reserved.en
heal.accesscampus-
heal.fullTextAvailabilityTRUE-
heal.identifier.primaryDoi 10.1016/S0168-583x(00)00472-9-
heal.identifier.secondary<Go to ISI>://000169403700048-
heal.journalNameNuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atomsen
heal.journalTypepeer reviewed-
heal.languageen-
heal.publicationDate2001-
heal.publisherElsevieren
heal.recordProviderΠανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικώνel
heal.typejournalArticle-
heal.type.elΆρθρο Περιοδικούel
heal.type.enJournal articleen

Αρχεία

Φάκελος/Πακέτο αδειών

Προβολή: 1 - 1 of 1
Φόρτωση...
Μικρογραφία εικόνας
Ονομα:
license.txt
Μέγεθος:
1.74 KB
Μορφότυπο:
Item-specific license agreed upon to submission
Περιγραφή: