Rare-earth silicide thin film study. Comparison of heavy ion and conventional RBS
| dc.contributor.author | Aloupogiannis, P. | en |
| dc.contributor.author | Travlos, A. | en |
| dc.contributor.author | Aslanoglou, X. | en |
| dc.contributor.author | Pilakouta, M. | en |
| dc.contributor.author | Weber, G. | en |
| dc.date.accessioned | 2015-11-24T18:38:03Z | |
| dc.date.available | 2015-11-24T18:38:03Z | |
| dc.identifier.issn | 0042-207X | - |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/17270 | |
| dc.rights | Default Licence | - |
| dc.title | Rare-earth silicide thin film study. Comparison of heavy ion and conventional RBS | en |
| heal.abstract | Rare-earth silicides have been studied by RBS spectrometry and X-ray diffraction. 12C and 4He RBS at 10 and 2 MeV, respectively, were used in order to compare heavy ion RBS (HIRBS) with conventional 4He RBS. 12C RBS gives better mass resolution for heavy elements (M > 28 amu), but slightly poorer depth resolution in comparison with conventional RBS. In addition, the limited accuracy with which stopping power data of 12C are known limits the accuracy of HIRBS. | en |
| heal.access | campus | - |
| heal.fullTextAvailability | TRUE | - |
| heal.identifier.primary | http://dx.doi.org/10.1016/0042-207X(93)90009-Y | - |
| heal.identifier.secondary | http://www.sciencedirect.com/science/article/pii/0042207X9390009Y | - |
| heal.journalName | Vacuum | en |
| heal.journalType | peer reviewed | - |
| heal.publicationDate | 1993 | - |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών και Τεχνολογιών. Τμήμα Βιολογικών Εφαρμογών και Τεχνολογιών | el |
| heal.type | journalArticle | - |
| heal.type.el | Άρθρο Περιοδικού | el |
| heal.type.en | Journal article | en |
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